ETS 2012 - Call for Participation

CALL FOR PARTICIPATION

Scope -- Key Dates-- Venue -- Workshop Registration -- Advance Program -- More Information -- Committees

Scope

The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing.

In 2012 ETS will take place in Imperial Palace, Annecy, France and is being organized by TIMA Laboratory (CNRS, Grenoble INP, UJF) and sponsored by the Test Technology Technical Council of the IEEE Computer Society. A Test Spring School will is organized in conjunction with ETS’12.

Keynote 1: Goldilocks Failures: Not Too Soft, Not Too Hard, Sani Nassif, IBM, USA

Keynote 2: Chip Stacking: The Sky Is The Limit, Erik Jan Marinissen, IMEC,BE

Invited presentation: Power-Aware Testing: The Next Stage, Xiaoqing Wen, Kyushu Institute of Technology, Japan

TECHNICAL PAPER SESSIONS will present the latest research results in test, including:

Analog Test
Automatic Test Generation
Board Test and Diagnosis
Delay & Performance Test
Dependability
Design for Test(ability) (DfT)
Design Verification and Validation
Diagnosis and Debug
Fault Modeling and Simulation
Fault Tolerance
Memory Test & Repair
Mixed-Signal Test
Nanotechnology Test
On-Line Test
Power Issues in Test
Reliability
RF Test
Stacked IC Test
System-on-Chip (SoC) Test
Test Quality
Yield Analysis and Enhancement

SPECIAL SESSIONS

Several european and national projects on test and dependability are presented in 2 special sessions.

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VENDOR SESSIONS

Sponsors of the event and other industrial partners will present their most up-to-date results on test and reliability.

DOCTORAL STUDENT CONTEST

EMBEDDED TUTORIALS

Adaptive Testing: Conquering Process Variations
Introduction to the Defect-Oriented Cell-Aware Test Methodology for significant reduction of DPPM rates

FEATURED PANELS

VLSI Test Technology: Why is the field not sexy enough?
The impact of functional safety standards in the design and test of reliable and available integrated circuits
Board level test challenges

FRINGE WORKSHOPS

Workshop on Low Power Design Impact on Test and Reliability (LPonTR)
Workshop on Processor Verification, Test and Debug (IWPVTD)
Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)

SOCIAL ACTIVITIES

Welcome and final Gala Dinner
Montrottier Medieval Castle Visit
Gorges of Fier Hike
Eagles-Falcons Show

Key Dates

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Hotel reservation deadline: April 20, 2012
Symposium Advance Registration: April 26, 2012

Please, note that ETS 2012 week is high season in France (Pentecô=C3=B4te Holiday) and rooms in Annecy offer sell out early.

The Venue

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Annecy is a magnificent, very rich and well preserved historical city located in french Northern Alps, at the crossroad of great routes from Italy to Geneva.
From its dense history, Annecy has preserved some beautiful buildings which permanently enriched the heritage of the city. The Lake of Annecy becomes the symbol of the city, as well as Thion, a former industrial route that has become tourist attraction. Surrounded by impressive Aravis and Veryrier high altitude French Alpes, Annecy is nowadays an elegant and sophisticated lakeside resort with a pleasant port and beaches.

Workshop Registration

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Click here to register.

Advance Program

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For draft of program click here!

More Information

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General Information
Lorena ANGHEL
General Chair
=09 TIMA Laboratory, Grenoble, FR
Lorena.Anghel@imag.fr

Program Information
Program Chair
Massimo VIOLANTE
Politecnico di Torino, Torino, Italy
Email: massimo.violante@polito.it

Committees

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Organizing Committee

General Chair/ Vice Chair
Lorena Anghel, TIMA, FR
Patrick Girard, LIRMM, FR

Program Chair/Vice Chair
Massimo Violante, Politecnico di Torino, IT
Bernd Becker, U. Freiburg, D

Industrial Relations Chair/Vice-Chair
Regis Leveugle, TIMA,FR
Michele Portolan, Alcatel Lucent, FR

Publications Chair
Giorgio Di Natale, LIRMM, FR

Publicity Chair
Stefano Di Carlo, Poltecnico di Torino, IT

Embedded Tutorial Chair
Goerschwin Fey, U. Bremen, DE

Panel Chair
Rob Aitken, ARM, USA

Fringe Workshops
Jaan Raik, U. Tallin, EE

Student Activity Chair
Ilia Polian, U. Passan, DE

Award Chair
Peter Maxwell, Aptina, USA

Topic Chairs

L. Carro, UFRGS, BR
K. Chakrabarty, Duke U., US
S. Hamdioui, TU Delft, NL
S. Hellebrand, U. Paderborn, DE
E. Larsson, U. Linköpings, SE
C. Metra, U. Bologna, IT

S. Mir, TIMA, FR
J. Rivoir, Verigy, DE
M. Sonza Reorda, Pol. di Torino, IT
B. Vermeulen, NXP Semiconductors, NL

Regional Liaisons
E. Cota, BR - South America
S. Kajihara, JP - Asia
A. Osseiran, AU - Australia
A. Singh, US - North America
A. Wahba, EG - Africa

Organizing Committee

Mounir Benabdenbi, Dominique Borrione, TIMA, FR - Local Chairs
Paolo Maistri, TIMA, FR - Finance Chair
Emmanuel Simeu, TIMA, FR - Registration Chair
Haralampos Stratigopoulos, TIMA, FR - Audio-visual Chair

Program Committee

Magdy Abadir, US	Sandeep K. Goel, USA	Alex Orailloglu, US
Rob Aitken, US	Elena Gramatova, SK	Sule Ozev, US
Zaid Al-Ars, NL	Kazumi Hatayama, JP	András Pataricza, HU
Walter Anheier, DE	Mokhtar Hirech, US	Frank Poehl, DE
Jean Arlat, FR	Michiko Inoue, JP	Janusz Rajski, US
Florence Azais, FR	Tomoo Inoue, JP	Bruno Rouzeyre, FR
Mohamed Azimane, NL	Andre Ivanov, CA	Antonio Rubio, ES
Luz Balado, ES	Gert Jervan, EE	Kewal Saluja, US
Paolo Bernardi, IT	Rohit Kapur, US	Pablo Sanchez, ES
Alex Bystrov, UK	Svein J. Knapskog, NO	Juergen Schloeffel, DE
Stefano Di Carlo, IT	Zdenek Kotasek, CZ	Jaume Segura, ES
Giorgio Di Natale, FR	Andrzej Krasniewski, PL	Virendra Singh, IN
Gunnar Carlsson, SE	Rene Krenz-Baath, DE	Mehdi B.Tahoori, DE
Abhijit Chatterjee, US	Bram Kruseman, NL	Mohammad Tehranipoor, US
Wu-Tung Cheng, US	Sandip Kundu, US	J. Paulo Teixeira, PT
Al Crouch, US	Wolfgang Kunz, DE	Nur Touba, US
Jerzy Dabrowski, SE	Saqib Khursheed, UK	Jerzy Tyszer, PL
Daniela De Venuto, IT	Regis Leveugle, FR	Raimund Ubar, EE
Rainer Dorsch, DE	Marcelo Lubaszewski, BR	Arnaud Virazel, FR
Görschwin Fey, DE	Yiorgos Makris, US	Xiaoqing Wen, JP
Marie-Lise Flottes, FR	Peter Maxwell, US	Qiang Xu, HK
Franco Fummi, IT	Subhasish Mitra, US	Heinrich T. Vierhaus, DE
Emil Gizdarski, USA	Zainalabedini Navabi, IR
Dimitris Gizopoulos, GR	Franc Novak, SI

For more information, visit us on the web at: http://www.ieee-ets.org

The European Test Symposium (ETS 2012 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).